PHSCS 588
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Scanning Electron Microscopy (SEM) for Physical Science and Engineering
Physics and Astronomy
College of Physical and Mathematical Sciences
Course Description
Theoretical aspects of sample preparation, basic and advanced imaging, X-ray energy dispersive spectrometry, and other analytical materials characterization techniques on the scanning electron microscope (SEM).
When Taught
Contact Department
Min
3
Fixed/Max
3
Fixed
2
Fixed
3
